Modelling of glitch measurement to determine instability issues in magnetoresistive devices

A theoretical study of the commonly used measurements in the time domain to investigate instability in magnetoresistive (MR) devices and sensors is conducted. This is based on a simple model for devices considered to be noise systems having instability that is accounted for by random telegraph noise and additional Gaussian baseline noise. The efficiency, sensitivity and limitation of the measurements for given instability phenomena and properties are the main focus of the analysis. The methodology and principle of the study could serve as a guideline for further efforts towards optimising instability measurements and better understanding instability issues in MR devices.