DocumentCode
1044399
Title
VLSI Testing
Author
Williams, T.W.
Author_Institution
IBM Boulder
Volume
17
Issue
10
fYear
1984
Firstpage
126
Lastpage
136
Keywords
Design for testability; Fault detection; Logic testing; Performance evaluation; Power engineering and energy; Semiconductor device modeling; Test pattern generators; Very large scale integration;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/MC.1984.1658965
Filename
1658965
Link To Document