DocumentCode
1044680
Title
Epitaxial V-groove bipolar integrated circuit process
Author
Rodgers, J.T. ; Meindl, James D.
Author_Institution
Stanford University, Stanford, Calif.
Volume
20
Issue
3
fYear
1973
fDate
3/1/1973 12:00:00 AM
Firstpage
226
Lastpage
232
Abstract
A new four-mask "V-groove" process for the fabrication of bipolar integrated circuits has been developed. The process utilizes epitaxial ν/n+/n-layers and anisotropic etching of
silicon to eliminate the buried layer and isolation diffusions as well as the need for masking the base diffusion of the standard six-mask bipolar integrated circuit process, n-p-n transistor, resistor, and Schottky diode characteristics are equivalent to or exceed those of the standard process. A five-mask V-groove process provides improved lateral p-n-p transistors compared with the four-mask approach. The V-groove integrated circuit structure offers simpler processing, smaller isolation capacitances, lower parasitic collector resistances, larger packing densities, and higher junction breakdown voltages than standard bipolar integrated circuits without degradation of other properties.
silicon to eliminate the buried layer and isolation diffusions as well as the need for masking the base diffusion of the standard six-mask bipolar integrated circuit process, n-p-n transistor, resistor, and Schottky diode characteristics are equivalent to or exceed those of the standard process. A five-mask V-groove process provides improved lateral p-n-p transistors compared with the four-mask approach. The V-groove integrated circuit structure offers simpler processing, smaller isolation capacitances, lower parasitic collector resistances, larger packing densities, and higher junction breakdown voltages than standard bipolar integrated circuits without degradation of other properties.Keywords
Anisotropic magnetoresistance; Bipolar integrated circuits; Bipolar transistor circuits; Degradation; Etching; Fabrication; Parasitic capacitance; Resistors; Schottky diodes; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17633
Filename
1477290
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