• DocumentCode
    1044680
  • Title

    Epitaxial V-groove bipolar integrated circuit process

  • Author

    Rodgers, J.T. ; Meindl, James D.

  • Author_Institution
    Stanford University, Stanford, Calif.
  • Volume
    20
  • Issue
    3
  • fYear
    1973
  • fDate
    3/1/1973 12:00:00 AM
  • Firstpage
    226
  • Lastpage
    232
  • Abstract
    A new four-mask "V-groove" process for the fabrication of bipolar integrated circuits has been developed. The process utilizes epitaxial ν/n+/n-layers and anisotropic etching of \\langle 100\\rangle silicon to eliminate the buried layer and isolation diffusions as well as the need for masking the base diffusion of the standard six-mask bipolar integrated circuit process, n-p-n transistor, resistor, and Schottky diode characteristics are equivalent to or exceed those of the standard process. A five-mask V-groove process provides improved lateral p-n-p transistors compared with the four-mask approach. The V-groove integrated circuit structure offers simpler processing, smaller isolation capacitances, lower parasitic collector resistances, larger packing densities, and higher junction breakdown voltages than standard bipolar integrated circuits without degradation of other properties.
  • Keywords
    Anisotropic magnetoresistance; Bipolar integrated circuits; Bipolar transistor circuits; Degradation; Etching; Fabrication; Parasitic capacitance; Resistors; Schottky diodes; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17633
  • Filename
    1477290