• DocumentCode
    1044814
  • Title

    Fabrication of a nanophotonic quantum dot waveguide and photodetector integrated device

  • Author

    Huang, L. ; Hegg, M.C. ; Wang, C-J. ; Lin, L.Y.

  • Author_Institution
    Dept. of Phys., Univ. of Washington, Seattle, WA
  • Volume
    2
  • Issue
    4
  • fYear
    2007
  • fDate
    12/1/2007 12:00:00 AM
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    The authors present the design and fabrication of a nanophotonic waveguide and photodetector integrated device by molecular self-assembly of nanocrystal quantum dots (QD) and two different nano-gap formation techniques, namely electromigration-induced break-junction technique and electron beam lithography nano-gap patterning. A QD waveguide with ^50 nm width integrated with a nano-scale QD photodetector is achieved. A comparison is made between the two nano-gap techniques. In addition, a method to achieve high alignment accuracy for nanophotonic integration is discussed.
  • Keywords
    electromigration; electron beam lithography; integrated optics; nanoelectronics; optical waveguides; optoelectronic devices; photodetectors; quantum dots; self-assembly; electromigration-induced break-junction technique; electron beam lithography; molecular self-assembly; nano-gap formation; nanocrystal quantum dots; nanophotonic integration; nanophotonic quantum dot waveguide; photodetector integrated device;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl:20070053
  • Filename
    4436218