• DocumentCode
    1044888
  • Title

    An Internally-Matched High-Isolation CMOS SPDT Switch Using Leakage Cancellation Technique

  • Author

    Chang, Shuen-Chien ; Chang, Sheng-Fuh ; Chih, Ting-Yueh ; Tao, Jian-An

  • Author_Institution
    Nat. Chung Cheng Univ., Chiayi
  • Volume
    17
  • Issue
    7
  • fYear
    2007
  • fDate
    7/1/2007 12:00:00 AM
  • Firstpage
    525
  • Lastpage
    527
  • Abstract
    An internally-matched single-pole double-throw (SPDT) switch with high isolation is presented. The high isolation is resulted from the leakage cancellation by employing a compensation circuit, which also achieves impedance match for all ports. The SPDT chip, implemented in a 0.18-mum CMOS process, achieves a measured isolation of 72 dB, an insertion loss of 1.1 dB, return losses better than 10 dB at all ports and PidB of 19.3 dBm at 1.9 GHz.
  • Keywords
    CMOS integrated circuits; leakage currents; microwave switches; CMOS SPDT switch; compensation circuit; frequency 1.9 GHz; leakage cancellation technique; loss 1.1 dB; single-pole double-throw switch; size 0.18 mum; CMOS technology; Impedance; Insertion loss; MOSFETs; Radio frequency; Switches; Switching circuits; Topology; Ultra wideband technology; Wireless LAN; CMOS; internally-matched; isolation; switch;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2007.899317
  • Filename
    4266830