DocumentCode
1044888
Title
An Internally-Matched High-Isolation CMOS SPDT Switch Using Leakage Cancellation Technique
Author
Chang, Shuen-Chien ; Chang, Sheng-Fuh ; Chih, Ting-Yueh ; Tao, Jian-An
Author_Institution
Nat. Chung Cheng Univ., Chiayi
Volume
17
Issue
7
fYear
2007
fDate
7/1/2007 12:00:00 AM
Firstpage
525
Lastpage
527
Abstract
An internally-matched single-pole double-throw (SPDT) switch with high isolation is presented. The high isolation is resulted from the leakage cancellation by employing a compensation circuit, which also achieves impedance match for all ports. The SPDT chip, implemented in a 0.18-mum CMOS process, achieves a measured isolation of 72 dB, an insertion loss of 1.1 dB, return losses better than 10 dB at all ports and PidB of 19.3 dBm at 1.9 GHz.
Keywords
CMOS integrated circuits; leakage currents; microwave switches; CMOS SPDT switch; compensation circuit; frequency 1.9 GHz; leakage cancellation technique; loss 1.1 dB; single-pole double-throw switch; size 0.18 mum; CMOS technology; Impedance; Insertion loss; MOSFETs; Radio frequency; Switches; Switching circuits; Topology; Ultra wideband technology; Wireless LAN; CMOS; internally-matched; isolation; switch;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2007.899317
Filename
4266830
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