• DocumentCode
    1045152
  • Title

    Outage probability for optimum combining of arbitrarily faded signals in the presence of correlated Rayleigh interferers

  • Author

    Zhang, Q.T. ; Cui, X.W.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
  • Volume
    53
  • Issue
    4
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1043
  • Lastpage
    1051
  • Abstract
    Exact outage-probability analysis for optimum combining of arbitrarily faded signals in the presence of correlated Rayleigh-faded interferers is not available in the literature. In this paper, we show that the conditional probability density of the reciprocal of the instantaneous signal-to-interference ratio (SIR), given the signal vector, can be represented as the higher order derivative of a simple exponential function in signal power whereby generic formulas for the outage probability and probability density function related to SIR can be determined. The new formulas take simple closed form in terms of the characteristic function of the signal vector. They are, therefore, widely applicable, leading to various results for correlated Rayleigh-, Rician-, and Nakagami-faded signals. Numerical examples are also presented for illustration.
  • Keywords
    Rayleigh channels; Rician channels; diversity reception; probability; radiofrequency interference; arbitrarily faded signals; correlated Nakagami fading; correlated Rayleigh interferers; correlated Rician fading; optimum combining; outage probability analysis; probability density function; signal-to-interference ratio; Covariance matrix; Diversity reception; Gaussian distribution; MIMO; Performance analysis; Probability density function; Rayleigh channels; Rician channels; Signal analysis; Transmitting antennas; Correlated Nakagami fading; correlated Rayleigh fading; correlated Rician fading; optimum combining; outage probability;
  • fLanguage
    English
  • Journal_Title
    Vehicular Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/TVT.2004.830953
  • Filename
    1317208