• DocumentCode
    1045971
  • Title

    Measuring high-bandwidth signals in CMOS circuits

  • Author

    Larsson, Peter ; Svensson, Christer

  • Author_Institution
    Dept. of Phys. & Meas., Linkoping Inst. of Technol., Sweden
  • Volume
    29
  • Issue
    20
  • fYear
    1993
  • Firstpage
    1761
  • Lastpage
    1762
  • Abstract
    Presents a technique to measure details of the shape of high-bandwidth signals in CMOS circuits. This technique allows one to study quantities in the subnanosecond range as, for instance, the rise time of a clock edge or the detailed shape of noise pulses.
  • Keywords
    CMOS integrated circuits; integrated circuit testing; CMOS circuits; clock edge; high-bandwidth signals; noise pulses; rise time; subnanosecond range;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19931173
  • Filename
    274901
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1045971