• DocumentCode
    1048390
  • Title

    Thermal analysis of multiple-layer structures

  • Author

    Kokkas, Achilles G.

  • Author_Institution
    RCA Laboratories, Princeton, N. J.
  • Volume
    21
  • Issue
    11
  • fYear
    1974
  • fDate
    11/1/1974 12:00:00 AM
  • Firstpage
    674
  • Lastpage
    681
  • Abstract
    The response of temperature to dc and steady-state ac power inputs in multiple-layer rectangular structures has been derived by solving analytically the problem of heat flow in three dimensions. Attention is focused on electrothermal integrated circuit (IC) substrates consisting of a semiconductor, a thermal conductor, and a thermal insulator. The analysis applies as well to single-layer systems, such as conventional IC substrates, for which the transient response of temperature has also been found.
  • Keywords
    Circuits; Electrothermal effects; Insulation; Materials science and technology; Mathematical model; Performance analysis; Substrates; Temperature dependence; Thermal conductivity; Thermal management;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1974.17993
  • Filename
    1477808