DocumentCode
1049918
Title
Influence of intermediate layers on coercive force of laminated Co-P films
Author
Fisher, Roy ; Jones, E.
Author_Institution
Ferroxcube Corporation, Saugerties, N.Y.
Volume
8
Issue
3
fYear
1972
fDate
9/1/1972 12:00:00 AM
Firstpage
472
Lastpage
472
Abstract
This paper investigated the coercive force (Hc ) of laminated Co-P films. The films were laminated by introducing intermediate layers of Pd (
Å) or nonmagnetic Ni-P (T = 250 Å) between the Co-P films. The thickness of the Co-P films was varied from 650 Å to 2600 Å but was maintained constant within any series of laminations. The Hc was evaluated as a function of total thickness for multiple Co-P laminate thicknesses up to 10,000 Å. The Hc of laminated Co-P films with intermediate Pd layers increased with total lamination thickness regardless of the thickness of the individual Co-P film. However, Co-P laminates deposited from a dilute solution with intermediate layers of Ni-P exhibited Hc values independent of the total lamination thickness. The Hc was independent of the total lamination thickness regardless of the base material provided Ni-P was deposited as the substrate. The magnitude of the Hc was dependent on the Co-P film thickness. The Hc of such Co-P laminates can be adjusted from 340 Oe to 700 Oe by selection of the appropriate thickness of the Co-P film. Co-P laminates deposited from a concentrated solution with intermediate layers of Ni-P exhibit Hc values which decrease with total lamination thickness. These films exhibited lower Hc values than nonlaminated Co-P films.
Å) or nonmagnetic Ni-P (T = 250 Å) between the Co-P films. The thickness of the Co-P films was varied from 650 Å to 2600 Å but was maintained constant within any series of laminations. The HKeywords
Cobalt-phosphorus films; Magnetic recording materials; Multilayer magnetic films; Coercive force; Disk recording; Indium tin oxide; Laboratories; Laminates; Lamination; Magnetic recording; Transistors; Video recording; Videoconference;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1972.1067382
Filename
1067382
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