• DocumentCode
    1051209
  • Title

    MOVPE growth of long wavelength AlGaAsSb/InP Bragg mirrors

  • Author

    Ostinelli, O. ; Almuneau, G. ; Ebnöther, M. ; Gini, E. ; Haiml, M. ; Bächtold, W.

  • Author_Institution
    Dept. for Inf. Technol. & Electr. Eng., Swiss Fed. Inst. of Technol., Zurich, Switzerland
  • Volume
    40
  • Issue
    15
  • fYear
    2004
  • fDate
    7/22/2004 12:00:00 AM
  • Firstpage
    940
  • Lastpage
    942
  • Abstract
    Monolithic distributed Bragg reflectors (DBRs) consisting of AlGaAsSb/InP quarter-wave multilayer were grown by metal-organic vapour-phase epitaxy (MOVPE) on InP substrates. The quality of antimonide MOVPE grown material has been optimised to achieve highly reflective, defect-free, DBR stacks. With 21 AlGaAsSb/InP periods, reflectivity up to 97% at 1.59 μm was measured.
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; distributed Bragg reflectors; gallium arsenide; indium compounds; optical fabrication; optical multilayers; reflectivity; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; 1.59 micron; AlGaAsSb-InP; DBR stacks; MOVPE growth; long wavelength Bragg mirrors; metal organic vapour phase epitaxy growth; monolithic distributed Bragg reflectors; quarter wave multilayer;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20045373
  • Filename
    1318881