DocumentCode
1052619
Title
Consideration of feed-through voltage in amorphous-Si TFT´s
Author
Takabatake, Masaru ; Tsumura, Makoto ; Nagae, Yoshiharu
Author_Institution
Hitachi Ltd., Ibaraki, Japan
Volume
40
Issue
10
fYear
1993
fDate
10/1/1993 12:00:00 AM
Firstpage
1866
Lastpage
1870
Abstract
Feedthrough voltage is an important factor in designing integrated data drive circuits and display area in thin-film-transistor liquid-crystal displays (TFT LCDs). With respect to feedthrough voltage, only the gate-source overlay capacitance has been considered in amorphous-Si (a-Si) TFTs, because of their staggered structure with overlap area. It is pointed out that, in a-Si TFTs designed as active elements, feedthrough voltage is mainly due to the carrier redistribution. The main reason is that, since the field-effect mobility is low (W /L >1), the leakage current must be kept low (L ⩾10 μm), and an active layer is inserted in the overlap area (unlike the case with MOS device structures), the area of the active layer is large. Taking the carrier redistribution into account, the maximum difference between the voltage obtained using the modified model and the experimental voltage is within 20%. By comparison, the results obtained using the previous model for TFTs are approximately three times smaller than the experimental results
Keywords
amorphous semiconductors; capacitance; carrier mobility; elemental semiconductors; insulated gate field effect transistors; leakage currents; liquid crystal displays; semiconductor device models; silicon; thin film transistors; TFT; active layer; amorphous Si; carrier redistribution; feed-through voltage; feedthrough voltage; field-effect mobility; gate-source overlay capacitance; integrated data drive circuits; leakage current; liquid-crystal displays; modified model; overlap area; staggered structure; thin-film-transistor; Amorphous materials; Capacitance; Circuits; Constitution; Displays; Drives; Leakage current; MOS devices; Thin film transistors; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.277346
Filename
277346
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