• DocumentCode
    1054063
  • Title

    Modeling of Parasitic Inductive Couplings in a Pi-Shaped Common Mode EMI Filter

  • Author

    Chen, Henglin ; Qian, Zhaoming ; Zeng, Zhaohui ; Wolf, Christian

  • Author_Institution
    Zhejiang Univ., Hangzhou
  • Volume
    50
  • Issue
    1
  • fYear
    2008
  • Firstpage
    71
  • Lastpage
    79
  • Abstract
    This paper analyzes the effects of parasitic inductive couplings among the filter components and printed circuit board traces in a pi-shaped common mode (CM) electromagnetic interference (EMI) filter. The result shows that some parasitic inductive couplings related with CM choke do not affect the CM EMI filter performance. And then, it proposes a high-frequency circuit model for filtration performance evaluation and prediction for pi-shaped CM EMI filter, in which the parasitic inductive coupling between input and output loops of the investigated filter is considered to be the crucial coupling parameter while other parasitic couplings are ignored. The model is simple because only one coupling parameter is involved. A procedure is introduced to extract the inductive coupling between input and output loops in pi-shaped CM EMI filter using Z parameters through virtual prototyping. Simulation and experiment finally validate the model.
  • Keywords
    electromagnetic interference; power filters; printed circuits; Pi-shaped common mode EMI filter; Z parameters; electromagnetic interference; filtration performance evaluation; high-frequency circuit model; motor-drive applications; parasitic inductive couplings; pi-shaped common mode; printed circuit board; Coupling circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic interference; Filters; Filtration; Inductors; Predictive models; Printed circuits; Virtual prototyping; Circuit analysis; common mode; electromagnetic interference (EMI) filter; inductive coupling; modeling;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2007.913214
  • Filename
    4444636