• DocumentCode
    1055350
  • Title

    Modeling light reflection for computer color vision

  • Author

    Lee, Hsien-Che ; Breneman, Edwin J. ; Schulte, Carl P.

  • Author_Institution
    Eastman Kodak Co., Rochester, NY, USA
  • Volume
    12
  • Issue
    4
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    402
  • Lastpage
    409
  • Abstract
    In computer vision applications, analysis of shading information requires a proper model of light reflection from object surfaces. To overcome the shortcoming of the most often used model and to extend the reflection model for computer color vision, an examination is made of the light reflection problem using the bidirectional spectral-reflectance distribution function (BSRDF) to specify both incident- and reflected-beam geometries. It is shown that the product form can still be retained for a polychromatic light source under two lighting conditions: the light source is collimated; or the spectral factor and the geometric factor can be separated for both the light source and the BSRDF of the surface. The reflection model is then applied to the formulation of a neutral-interface-reflection model, which is tested experimentally. The results show the adequacy of this type of model for surfaces of some material compositions, e.g. plastics, plant leaves, painted surfaces, orange peels, and some glossy cloth, but not for others, e.g. colored paper and some ceramics
  • Keywords
    colour; computer vision; light reflection; reflectivity; bidirectional spectral-reflectance distribution function; collimated light source; computer color vision; geometric factor; glossy cloth; incident beam geometry; light reflection; neutral-interface-reflection model; orange peels; painted surfaces; plant leaves; plastics; polychromatic light source; reflected-beam geometries; shading; spectral factor; Application software; Computational geometry; Computer vision; Distributed computing; Distribution functions; Information analysis; Light sources; Optical collimators; Optical reflection; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.50626
  • Filename
    50626