• DocumentCode
    1057684
  • Title

    Benchmarking the Compton coincidence technique for measuring electron response nonproportionality in inorganic scintillators

  • Author

    Rooney, Brian D. ; Valentine, John D.

  • Author_Institution
    Dept. of Mech., Ind., & Nucl. Eng., Cincinnati Univ., OH, USA
  • Volume
    43
  • Issue
    3
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    1271
  • Lastpage
    1276
  • Abstract
    To study the light yield nonproportionality of inorganic scintillation materials, a Compton coincidence experiment has been designed and implemented. The coincidence technique is used to measure the nearly mono-energetic scintillators electron response by recording events only when energetic electrons are produced by gamma rays that are Compton scattered through a specific angle. This technique provides the ability to accurately determine the light yield nonproportionality of scintillation materials as a function of electron energy while minimizing the potential complicating effects of surface interactions and X-ray escape. To benchmark the Compton coincidence technique (CCT), the electron response for NaI(Tl) has been measured for electron energies from 2 keV to 450 keV and compared to previously-published analytical and measured light yield electron responses. These CCT results are believed to be the most accurate NaI(Tl) electron response measurements to date for energies below 20 keV where the light yield non-proportionality is most pronounced
  • Keywords
    coincidence techniques; electron detection; sodium compounds; solid scintillation detectors; 2 to 450 keV; Compton coincidence technique; NaI(Tl); NaI:Tl; electron response nonproportionality; inorganic scintillators; light yield nonproportionality; Electromagnetic wave absorption; Electrons; Energy measurement; Gamma rays; Inorganic materials; Light scattering; Particle measurements; Size measurement; Surface treatment; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.506676
  • Filename
    506676