• DocumentCode
    1057771
  • Title

    Degenerate Pump–Probe Photoluminescence Study on Quantum Dots Operating in Linear Recombination Regime

  • Author

    Su, Li-Chieh ; Wu, Der-Chin ; Mao, Ming-Hua

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • Volume
    21
  • Issue
    5
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    289
  • Lastpage
    291
  • Abstract
    The carrier lifetime of self-assembled quantum dots (QDs) is investigated by a time-resolved degenerate pump-probe photoluminescence (PL) measurement at room temperature. The suitable excitation range for this time-resolved measurement is in the linear recombination regime as determined from the excitation power dependence of the PL intensity. Carrier lifetimes from this time-resolved measurement are consistent with those obtained from the time correlated single photon counting technique. This study suggests a potential application of this technique to measure the carrier lifetime of QDs in the infrared region with wavelength longer than 1.1 mu m where no high-speed and high sensitivity photon counting devices are available.
  • Keywords
    III-V semiconductors; carrier lifetime; indium compounds; infrared detectors; photoluminescence; photon counting; self-assembly; semiconductor quantum dots; time resolved spectra; InAs; carrier lifetime; excitation power; infrared region; linear recombination regime; photoluminescence intensity; photon counting; self-assembled quantum dots; temperature 293 K to 298 K; time-resolved degenerate pump-probe photoluminescence; Carrier lifetime; pump probe; quantum dots (QDs);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.2010870
  • Filename
    4738373