DocumentCode
1057771
Title
Degenerate Pump–Probe Photoluminescence Study on Quantum Dots Operating in Linear Recombination Regime
Author
Su, Li-Chieh ; Wu, Der-Chin ; Mao, Ming-Hua
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
Volume
21
Issue
5
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
289
Lastpage
291
Abstract
The carrier lifetime of self-assembled quantum dots (QDs) is investigated by a time-resolved degenerate pump-probe photoluminescence (PL) measurement at room temperature. The suitable excitation range for this time-resolved measurement is in the linear recombination regime as determined from the excitation power dependence of the PL intensity. Carrier lifetimes from this time-resolved measurement are consistent with those obtained from the time correlated single photon counting technique. This study suggests a potential application of this technique to measure the carrier lifetime of QDs in the infrared region with wavelength longer than 1.1 mu m where no high-speed and high sensitivity photon counting devices are available.
Keywords
III-V semiconductors; carrier lifetime; indium compounds; infrared detectors; photoluminescence; photon counting; self-assembly; semiconductor quantum dots; time resolved spectra; InAs; carrier lifetime; excitation power; infrared region; linear recombination regime; photoluminescence intensity; photon counting; self-assembled quantum dots; temperature 293 K to 298 K; time-resolved degenerate pump-probe photoluminescence; Carrier lifetime; pump probe; quantum dots (QDs);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2008.2010870
Filename
4738373
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