• DocumentCode
    1058376
  • Title

    Considerations for improving the accuracy of large-signal GaAs MESFET models to predict power amplifier circuit performance

  • Author

    Staudinger, Joe ; Golio, Mike ; Woodin, Charlie ; de Baca, Monica C

  • Author_Institution
    Motorola Inc., Tempe, AZ, USA
  • Volume
    29
  • Issue
    3
  • fYear
    1994
  • fDate
    3/1/1994 12:00:00 AM
  • Firstpage
    366
  • Lastpage
    373
  • Abstract
    Several approaches to large-signal GaAs MESFET modeling are considered as they apply to the design of high-efficiency portable communications equipment. The validity of each modeling approach is examined by comparing simulations to the fundamental and harmonic output power of a MESFET using load pull to represent typical amplifier load lines. Two effects which are believed to influence model accuracy are considered: 1) low-frequency dispersion in output conductance, and 2) modulation of the threshold voltage as a function of drain-source voltage. The results suggest that improved modeling of the modulation in threshold voltage with respect to drain-source voltage provides significantly more accurate predictions. In contrast, for these applications, when conventional approaches for adding low-frequency dispersion effects to the model were implemented, inaccurate predictions resulted
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; power amplifiers; power transistors; semiconductor device models; GaAs; GaAs MESFET models; amplifier load lines; drain-source voltage; fundamental output power; harmonic output power; large-signal models; load pull; low-frequency dispersion; output conductance; performance prediction; portable communications equipment; power amplifier circuit performance; threshold voltage modulation; Frequency; Gallium arsenide; High power amplifiers; Low-noise amplifiers; MESFET circuits; Operational amplifiers; Power amplifiers; Power generation; Predictive models; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.278363
  • Filename
    278363