• DocumentCode
    1058849
  • Title

    Selective emission of electrons from patterned negative electron affinity cathodes

  • Author

    Santos, Edval J.P. ; MacDonald, Noel C.

  • Author_Institution
    Dept. de Fisica, Univ. Federal de Pernambuco, Recife, Brazil
  • Volume
    41
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    607
  • Lastpage
    611
  • Abstract
    We have observed electron emission into vacuum from the exposed areas of a patterned p++-GaAs substrate which was coated with cesium and oxygen. The emission barrier is a double layer of titanium-tungsten/silicon nitride. The exposed areas of the cathode were activated to the negative electron affinity (NEA) condition. It has been an open question whether it would be possible to activate the exposed areas of a patterned GaAs cathode. This result opens the possibility of utilizing NEA cathode technology for projection electron beam lithography tools, NEA-based vacuum microelectronics devices, and a combination of bulk devices with NEA emitters. A picture of an emission pattern projected onto a phosphor screen is presented. Auger depth profile was used to determine the stability of the TiW/GaAs interface through the activation procedure. Short and long term current stability were measured. A technique for cathode recovery and reactivation has been developed
  • Keywords
    III-V semiconductors; cathodes; electron affinity; electron beam lithography; electron field emission; gallium arsenide; stability; titanium alloys; tungsten alloys; vacuum microelectronics; Auger depth profile; GaAs; NEA cathode technology; Si3N4-TiW-GaAs; activation procedure; cathode reactivation; cathode recovery; current stability; double layer; electron emission; emission barrier; p++-GaAs substrate; patterned negative electron affinity cathodes; projection electron beam lithography tools; vacuum microelectronics devices; Cathodes; Electron beams; Electron emission; Gallium arsenide; Lithography; Microelectronics; Phosphors; Silicon; Stability; Vacuum technology;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.278517
  • Filename
    278517