• DocumentCode
    1059279
  • Title

    Degradation of polymer dielectrics with nanometric metal-oxide fillers due to surface discharges

  • Author

    Maity, Parimal ; Basu, Sreetama ; Parameswaran, Vinod ; Gupta, Neeraj

  • Author_Institution
    Indian Inst. of Technol. Kanpur, Kanpur
  • Volume
    15
  • Issue
    1
  • fYear
    2008
  • fDate
    2/1/2008 12:00:00 AM
  • Firstpage
    52
  • Lastpage
    62
  • Abstract
    Recent research has indicated that dielectric properties of polymer insulating materials might be improved by the inclusion of nanosized particles dispersed in the polymer matrix. Insulating materials in power apparatus are often exposed to surface discharges in the course of normal operation. Surface degradation due to continued exposure to such discharges may cause deterioration of the surface, and could ultimately lead to catastrophic failure. The current work investigates the effect of inclusion of nanometric particles on the ability of a polymeric dielectric to resist degradation when exposed to surface discharges. The dielectric material used was epoxy resin, while nanosized alumina (Al2O3) and titania (TiO2) were used as fillers. Surface discharge tests were carried out on the specimens. The degraded surfaces were studied using a scanning electron microscope (SEM). Surface roughness measurements were made using a laser surface profilometer (LSP). It was observed that the degradation was greater for unfilled epoxy specimens than that for filled ones. Atomic force microscopy (AFM) and energy dispersive X-ray analysis (EDX) were used to identify surface changes in the dielectric material due to degradation. It has been conclusively shown that addition of even very small volume fractions of nanoparticles increases the resistance of the material to degradation due to surface discharges. A possible mechanism for surface degradation in nanocomposites has been proposed.
  • Keywords
    X-ray chemical analysis; alumina; atomic force microscopy; filled polymers; nanocomposites; titanium compounds; AFM; EDX; SEM; atomic force microscopy; energy dispersive X-ray analysis; epoxy resin; nanometric metal-oxide fillers; polymer dielectrics degradation; scanning electron microscope; surface discharges; surface roughness; volume fractions; Atomic force microscopy; Dielectric materials; Dielectrics and electrical insulation; Polymers; Rough surfaces; Scanning electron microscopy; Surface discharges; Surface resistance; Surface roughness; Thermal degradation;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/T-DEI.2008.4446736
  • Filename
    4446736