• DocumentCode
    1059456
  • Title

    Modification and Conversion of E-Beam Co-Evaporated Precursors for Fabricating High Critical Current {\\rm YBa}_{2}{\\rm Cu}_{3}{\\rm O}_{7-\\delta } Films

  • Author

    Zhang, Yifei ; Feenstra, Ron ; Cantoni, Claudia ; Christen, David K. ; Miller, Dean J.

  • Author_Institution
    Oak Ridge Nat. Lab., Oak Ridge, TN, USA
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    3188
  • Lastpage
    3191
  • Abstract
    Ex situ conversion of e-beam co-evaporated precursors was studied in an effort to fabricate high critical current YBCO films using the BaF2 process. The precursors were deposited on CeO2 buffered single crystal YSZ substrates. It was shown that an intermediate oxygenation annealing prior to the conversion modifies the precursor crystallinity and promotes c-axis epitaxial growth while randomly-oriented film formation is suppressed. With the modified precursors, a critical current density (Jc, 77 K & 0 T) of 2.1 MA/cm2 measured by SQUID magnetometry was obtained in 1.8 mum thick YBCO films. The mechanism of the pre-annealing effect was investigated by characterization of the precursors, quenched films, and fully converted films using XRD, SEM, and TEM. Cross-sectional TEM was used to study the early nucleation of YBCO film at the precursor/substrate interface. The significant effect of the precursor modification indicated that, in addition to optimizing conversion processing parameters, modifying the precursor is an effective way to achieve the desired epitaxial film structure and to obtain higher critical currents, Ic.
  • Keywords
    X-ray diffraction; annealing; barium compounds; critical current density (superconductivity); crystal orientation; high-temperature superconductors; nucleation; quenching (thermal); scanning electron microscopy; superconducting epitaxial layers; transmission electron microscopy; vacuum deposited coatings; vacuum deposition; yttrium compounds; BaF2 process; CeO2 buffered single crystal YSZ substrate; CeO2-Y2O3-ZrO2; SEM; SQUID magnetometry; TEM; XRD; YBCO film; YBa2Cu3O7-delta; c-axis epitaxial growth; conversion processing; critical current density; e-beam coevaporation; epitaxial film structure; high critical current superconducting film; magnetic flux density 0 T; nucleation; oxygenation annealing; precursor crystallinity; precursor-substrate interface; quenching; random orientation; temperature 77 K; Critical current density; YBCO film; epitaxial growth; nucleation;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2019213
  • Filename
    5067083