Modeling frequency fluctuations and noise thermometry using an R-SQUID noise thermometer

Author

Soulen, R.J. ; Fogle, W.E. ; Colwell, J.H.

Author_Institution

US Naval Res. Lab., Washington, DC, USA

Volume

42

Issue

2

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

320

Lastpage

323

Abstract

The white and additive noise generated by an R-SQUID noise thermometer whose temperature was varied from 6.3 mK to 0.738 K is measured. Room temperature simulations of the effect of white and additive noise on the circuit used to measure the noise for the R-SQUID are conducted. It is shown that the measured noise in all cases was fit to within the 0.1% statistical measurement imprecision by a model for the R-SQUID based on frequency modulation. This conformity is sufficiently good that any deficiencies in either do not lead to systematic inaccuracies in the noise temperature scale which exceed 0.1%. Comparisons of the R-SQUID with several other thermometers indicate that the overall agreement is at worst 0.2%

Keywords

SQUIDs; electric noise measurement; electron device noise; fluctuations; frequency modulation; frequency stability; low-temperature techniques; oscillators; thermometers; white noise; 6.3 mK to 0.738 K; R-SQUID noise thermometer; additive noise; frequency fluctuations; frequency modulation; frequency standard; model; noise thermometry; oscillator noise; resistor; simulations; white noise; Additive noise; Circuit noise; Counting circuits; Fluctuations; Frequency measurement; Noise generators; Noise measurement; Oscillators; Temperature; Time measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.278574

Filename

278574