• DocumentCode
    1059959
  • Title

    Procedures for the determination of the scattering parameters for network analyzer calibration

  • Author

    Heuermann, Holger ; Schiek, Burkhard

  • Author_Institution
    Inst. fuer Hochfrequenztech., Ruhr-Univ. Bochum, Germany
  • Volume
    42
  • Issue
    2
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    528
  • Lastpage
    531
  • Abstract
    Several methods to determine error-corrected scattering parameters are presented. These methods are applicable to double reflectometer test sets with four measurement channels. One of these methods of calculation is particularly fast and robust. Furthermore, a new method for the calculation of the error-corrected scattering parameters without using error correction coefficients is presented
  • Keywords
    S-parameters; calibration; microwave reflectometry; network analysers; double reflectometer test sets; error-corrected scattering parameters; network analyzer calibration; Artificial intelligence; Boundary conditions; Calibration; Equations; Error correction; Helium; Robustness; Scattering parameters; Switches; Testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.278617
  • Filename
    278617
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1059959