DocumentCode
1060455
Title
Characteristics of static induction transistors: Effects of series resistance
Author
Mochida, Yasunori ; Nishizawa, Jun-ichi ; Ohmi, Tadahiro ; Gupta, R.K.
Author_Institution
Nippon Gakki Company, Ltd., Hamamatsu, Japan
Volume
25
Issue
7
fYear
1978
fDate
7/1/1978 12:00:00 AM
Firstpage
761
Lastpage
767
Abstract
It is established experimentally that the I-V characteristics of a static induction transistor (SIT) and their temperature dependence are consistent with a major current transport mechanism of majority-carrier injection control plus the effect of series channel resistance. The I-V characteristics follow an exponential behavior in the low-current region and change to approximately a linear-or square-law relation in the high-current region where the negative feedback effect of the series channel resistance becomes pronounced. That the series channel resistance is small in the SIT and satisfies the condition that the product of series channel resistance and dc intrinsic transconductanee is less than unity is experimentally verified. The voltage amplification factor in the SIT has been confirmed to be almost constant for wide variations of drain current and ambient temperature.
Keywords
Electric resistance; Equivalent circuits; FETs; Helium; Linear approximation; Negative feedback; Temperature control; Temperature dependence; Transconductance; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19167
Filename
1479561
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