The influence of different underlayers on the microstructure and magnetic properties of very thin CoCr films deposited by RF-sputtering on glass computer disks

Author

Mapps, D.J. ; Pan, G. ; Akhter, M.A.

Author_Institution

Sch. of Electron., Commun. & Electr. Eng., Polytech. South West, Plymouth, UK

Volume

27

Issue

6

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

4903

Lastpage

4905

Abstract

Very thin CoCr films deposited on different kinds of underlayers on glass disk substrates were studied in order to understand the origin of underlayer effects. Nearly rectangular perpendicular magnetooptic Kerr effect loops were obtained from CoCr films on Si substrates. Transmission electron microscope electron diffraction studies of Ti(300 Å)/CoCr(160 Å) (which exhibits a rectangular loop) and Cr(300 Å)/CoCr(160 Å) (which exhibits a poorly shaped perpendicular loop) showed that the texture of the CoCr film was dominated by the texture of its underlayer. The epitaxial-growth model applies to these films

Keywords

Kerr magneto-optical effect; chromium alloys; cobalt alloys; crystal microstructure; ferromagnetic properties of substances; magnetic epitaxial layers; magnetic thin films; sputtered coatings; texture; transmission electron microscope examination of materials; Cr-CoCr layers; Cr/CoCr layers; Si substrates; TEM electron diffraction; Ti-CoCr layers; Ti/CoCr layers; epitaxial-growth model; glass computer disks; magnetic properties; microstructure; perpendicular magnetooptic Kerr effect loops; rectangular loop; texture; underlayer effects; very thin CoCr films; Chromium; Diffraction; Electron beams; Glass; Magnetic films; Magnetic properties; Microstructure; Optical reflection; Semiconductor films; Substrates;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.278693

Filename

278693