• DocumentCode
    106135
  • Title

    Relation Between Delay Line Phase Noise and Ring Oscillator Phase Noise

  • Author

    Homayoun, Aliakbar ; Razavi, Behzad

  • Author_Institution
    Electr. Eng. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA
  • Volume
    49
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    384
  • Lastpage
    391
  • Abstract
    The phase noise of a ring oscillator can be obtained by multiplying its open-loop phase noise by a simple shaping function. The shaping function is computed using first principles and is applicable to both flicker-noise-induced and white-noise-induced phase noise, leading to compact equations for ring oscillators. It is also shown that flicker noise upconversion in ring oscillators is primarily a function of the total gate capacitance and inevitable regardless of the risetime and falltime symmetry. Two oscillator prototypes fabricated in 65-nm CMOS technology verify the validity of the results.
  • Keywords
    CMOS integrated circuits; delay lines; flicker noise; phase noise; white noise; CMOS technology; compact equations; delay line; first principles; flicker noise upconversion; open-loop phase noise; oscillator prototypes; ring oscillator; simple shaping function; size 65 nm; white noise; Delay lines; Inverters; Jitter; Logic gates; Phase noise; Ring oscillators; Flicker noise; inverter phase noise; jitter; oscillator phase noise; phase noise; white noise;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2289893
  • Filename
    6672043