DocumentCode
1062522
Title
From the EIC
Author
Cheng, Tim
Volume
25
Issue
1
fYear
2008
Firstpage
4
Lastpage
4
Abstract
The design of next-generation RFICs remains challenging and demands innovation. In addition, with signal frequencies reaching tens of GHz, testing these circuits has created extraordinary challenges. This issue of D&T features a special issue on design and test of RFICs. This issue also includes an in-depth interview with Chris Rowen—founder, president, and CEO of Tensilica. In addition, there are four general-interest articles addressing diverse design and test issues.
Keywords
Chris Rowen; NoC; RFIC; hybrid approach; runtime power monitoring; simultaneous switching noise;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.11
Filename
4447900
Link To Document