• DocumentCode
    1062639
  • Title

    Hybrid-SBST Methodology for Efficient Testing of Processor Cores

  • Author

    Kranitis, Nektarios ; Merentitis, Andreas ; Theodorou, George ; Paschalis, Antonis ; Gizopoulos, Dimitris

  • Author_Institution
    Univ. of Athens, Athens
  • Volume
    25
  • Issue
    1
  • fYear
    2008
  • Firstpage
    64
  • Lastpage
    75
  • Abstract
    In this article, we introduce a hybrid-SBST methodology for efficient testing of commercial processor cores that effectively uses the advantages of various SBST methodologies. Self-test programs based on deterministic structural SBST methodologies combined with verification-based self-test code development and directed RTPG constitute a very effective H-SBST test strategy. The proposed methodology applies directed RTPG as a supplement to improve overall fault coverage results after component-based self-test code development has been performed.
  • Keywords
    automatic test pattern generation; logic testing; microprocessor chips; system-on-chip; processor core; random test-program generation; software-based self-test methodology; verification-based self-test code development; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Frequency; Instruction sets; Manufacturing processes; Microprocessors; Semiconductor device testing; Software testing; ATPG; H-SBST; RTPG; computer architecture; functional testing; microprocessor testing; software-based self-test;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.15
  • Filename
    4447912