Remanence curves of longitudinal thin films

Author

Dean, C. ; Chantrell, R.W. ; Hart, A. ; Parker, D.A. ; Miles, J.J.

Author_Institution

Sch. of Phys. & Astron., Lancashire Polytech., Preston, UK

Volume

27

Issue

6

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

4769

Lastpage

4771

Abstract

A micromagnetic model has been developed which is applied to the calculation of the principal remanence curves of a longitudinal thin film. The isothermal remanent magnetization curve (IRM) relies on the production of a realistic erased state. The authors developed an approach based on simulated annealing which produces a highly correlated demagnetized state. Comparison between the two curves via the Wohlfarth relation shows that the interparticle interactions are predominantly negative in a dipolar coupled thin film, indicating that exchange coupling is necessary in order to explain previously published experimental data

Keywords

magnetic annealing; magnetic hysteresis; magnetic recording; magnetic thin films; magnetisation; remanence; IRM; Wohlfarth relation; dipolar coupled thin film; erased state; exchange coupling; hysteresis loop; interparticle interactions; isothermal remanent magnetization curve; longitudinal thin film; magnetic recording; micromagnetic model; principal remanence curves; simulated annealing; Artificial intelligence; Astronomy; Magnetic films; Magnetic noise; Magnetization; Micromagnetics; Physics; Remanence; Simulated annealing; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.278941

Filename

278941