• DocumentCode
    1063570
  • Title

    Record head saturation and overwrite performance of a BaFe floppy disk drive

  • Author

    Jeffers, Fred ; Bero, James

  • Author_Institution
    Eastman Kodak Co., San Diego, CA, USA
  • Volume
    27
  • Issue
    6
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    4885
  • Lastpage
    4887
  • Abstract
    It is pointed out that barium ferrite (BaFe) media seem to be especially prone to poor overwrite, even when the measured coercivity is relatively low. One BaFe floppy disk drive manufacturer has included a separate wide-gap erase head to solve the problem. The low-frequency intrinsic coercivity of the BaFe disk was a nominal 735 Oe and the drive was equipped with a conventional small gap ferrite record head. With the erase head disabled, the maximum 2f/1f overwrite was 34 dB, where 2f indicates a linear density of 40 kFCI. That same BaFe disk was tested in another drive equipped with a tilted-sputtered-Sendust (TSS) metal-in-gap head which have a much higher overwrite of 40 dB. The signal and overwrite vs. record current curves were completely different. The very small BaFe particle and the unoriented coating cause its effective record coercivity to be much higher than the 735-Oe value measured at low frequency. This causes severe saturation in the ferrite record head and leads to poor overwrite performance. The TSS head is not saturated and so gives maximum overwrite and maximum signal with the same record current
  • Keywords
    barium compounds; coercive force; ferrite devices; floppy discs; magnetic heads; magnetic switching; BaFe12O19; effective record coercivity; floppy disk drive; low-frequency intrinsic coercivity; overwrite performance; record head saturation; small gap ferrite record head; switching field; tilted-sputtered-Sendust metal-in-gap head; Barium; Coatings; Coercive force; Drives; Ferrites; Floppy disks; Frequency measurement; Magnetic heads; Manufacturing; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.278979
  • Filename
    278979