• DocumentCode
    1065155
  • Title

    Storage loop definition for Bloch line memories

  • Author

    Boileau, F. ; Arnaud, Laurent ; Thiaville, Andre ; Vabre, M. ; Fontanet, E.

  • Author_Institution
    CEA/IRDI/BP, Grenoble, France
  • Volume
    24
  • Issue
    2
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    1719
  • Lastpage
    1721
  • Abstract
    A technique is presented to delineate correctly the position of the storage loops, i.e. domain walls where the Bloch line pairs have to sit for the operation of the memory. To make the loop confinement technique feasible over a wide range of material parameters, bias field values, and technological parameters, a grooving technique is chosen. A model is first described and various stability conditions are studied. Experimental realization of that technique is then presented and illustrated, and the confinement conditions are compared with the predictions of the model.
  • Keywords
    magnetic storage; Bloch line memories; bias field values; confinement conditions; domain walls; grooving technique; loop confinement technique; material parameters; stability conditions; storage loops; technological parameters; Garnets; Magnetic confinement; Magnetic domain walls; Magnetic domains; Magnetic materials; Magnetic separation; Potential well; Predictive models; Solid state circuits; Stability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.11581
  • Filename
    11581