DocumentCode
1065155
Title
Storage loop definition for Bloch line memories
Author
Boileau, F. ; Arnaud, Laurent ; Thiaville, Andre ; Vabre, M. ; Fontanet, E.
Author_Institution
CEA/IRDI/BP, Grenoble, France
Volume
24
Issue
2
fYear
1988
fDate
3/1/1988 12:00:00 AM
Firstpage
1719
Lastpage
1721
Abstract
A technique is presented to delineate correctly the position of the storage loops, i.e. domain walls where the Bloch line pairs have to sit for the operation of the memory. To make the loop confinement technique feasible over a wide range of material parameters, bias field values, and technological parameters, a grooving technique is chosen. A model is first described and various stability conditions are studied. Experimental realization of that technique is then presented and illustrated, and the confinement conditions are compared with the predictions of the model.
Keywords
magnetic storage; Bloch line memories; bias field values; confinement conditions; domain walls; grooving technique; loop confinement technique; material parameters; stability conditions; storage loops; technological parameters; Garnets; Magnetic confinement; Magnetic domain walls; Magnetic domains; Magnetic materials; Magnetic separation; Potential well; Predictive models; Solid state circuits; Stability;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.11581
Filename
11581
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