• DocumentCode
    1065922
  • Title

    MP-A3 GaAs digital IC technology/Statistical analysis of device performance

  • Author

    Zucca, R. ; Welch, B.M. ; Eden, R.C. ; Long, S.I.

  • Volume
    26
  • Issue
    11
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    1827
  • Lastpage
    1828
  • Keywords
    Circuit testing; Digital integrated circuits; Fabrication; Gallium arsenide; Integrated circuit technology; Large scale integration; Logic devices; Logic gates; Schottky diodes; Statistical analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19698
  • Filename
    1480276