DocumentCode
1065922
Title
MP-A3 GaAs digital IC technology/Statistical analysis of device performance
Author
Zucca, R. ; Welch, B.M. ; Eden, R.C. ; Long, S.I.
Volume
26
Issue
11
fYear
1979
fDate
11/1/1979 12:00:00 AM
Firstpage
1827
Lastpage
1828
Keywords
Circuit testing; Digital integrated circuits; Fabrication; Gallium arsenide; Integrated circuit technology; Large scale integration; Logic devices; Logic gates; Schottky diodes; Statistical analysis;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1979.19698
Filename
1480276
Link To Document