DocumentCode
1065988
Title
MP-B3 energy-resolved DLTS measurement of interface states in MOS devices
Author
Johnson, Noble M.
Volume
26
Issue
11
fYear
1979
fDate
11/1/1979 12:00:00 AM
Firstpage
1830
Lastpage
1831
Keywords
Capacitance measurement; Capacitance-voltage characteristics; Electron traps; Energy capture; Energy measurement; Interface states; MOS devices; Performance analysis; Pulse measurements; Spectroscopy;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1979.19705
Filename
1480283
Link To Document