• DocumentCode
    1066009
  • Title

    MP-B2 selective oxidation of silicon in RF-induced oxygen plasma

  • Author

    Sugano, Tatsuya

  • Volume
    26
  • Issue
    11
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    1830
  • Lastpage
    1830
  • Keywords
    Interface states; Isolation technology; Oxidation; Plasma materials processing; Plasma measurements; Plasma temperature; Semiconductor films; Silicon compounds; Stacking; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19707
  • Filename
    1480285