Bit-Error-Rate Measurements of RSFQ Shift Register Memories

Author

Hikida, Tomohiro ; Fujiwara, Kan ; Yoshikawa, Nobuyuki ; Fujimaki, Akira ; Terai, Hirotaka ; Yorozu, Shinichi

Author_Institution

Yokohama Nat. Univ., Yokohama

Volume

17

Issue

2

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

512

Lastpage

515

Abstract

Error rates of rapid-single-flux-quantum (RSFQ) shift register memories were investigated using a high-speed error-rate measurement system in order to demonstrate their reliability and stability. We designed and implemented an 8 times 8-bit shift register memory using the CONNECT cell library and the SRL 2.5 kA/cm² Nb process. The total number of Josephson junctions including the test system is 4184, and the circuit area is 2.1 mm times 3.2 mm. We measured the error rates of every storage node by reading out the data 2¹⁶ times at the clock frequency of 16 GHz. The measured error rates were lower than 10^-10 with DC bias margin better than plusmn5%.

Keywords

clocks; shift registers; CONNECT cell library; RSFQ shift register memories; bit-error-rate measurements; circuit reliability; circuit stability; clock frequency; frequency 16 GHz; rapid-single-flux-quantum; Circuit stability; Circuit testing; Clocks; Error analysis; Frequency measurement; Josephson junctions; Libraries; Niobium; Shift registers; System testing; Bit-error rate; Josephson logic; Josephson memories; RSFQ circuits; superconducting integrated circuits;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2007.898689

Filename

4277448