DocumentCode
1067367
Title
Modulation transfer function of extrinsic Si-detector arrays affected by optical crosstalk
Author
Büchtemann, Wolf
Author_Institution
Forschungsinstitut für Optik (FfO), Tübingen, Germany
Volume
27
Issue
1
fYear
1980
fDate
1/1/1980 12:00:00 AM
Firstpage
189
Lastpage
193
Abstract
It is shown in this paper that the imaging properties of crosstalk-affected silicon-detector arrays can be described by convolution of a line spread function (LSF) caused by detector width and of another one caused by crosstalk which is independent of detector width. For the Fourier transform of the latter LSF-the crosstalk MTF-there exists a simple analytic expression in the case of weak absorption: MTFC = Si (x)/x, Si being the sine integral. This is perfectly analogous to the MTF due to detector width:
. That means that you have the effects of crosstalk in a form compatible with imaging theory and it is possible to incorporate them into performance calculations. Computation of the minimum resolvable temperature difference (MRTD) for a number of assumed systems shows that the limiting spatial frequency is not much affected, thermal sensitivity at intermediate frequencies, however, can be noticeably degraded. These effects can be offset by decreasing the width of the detectors and/or by increasing net thermal sensitivity.
. That means that you have the effects of crosstalk in a form compatible with imaging theory and it is possible to incorporate them into performance calculations. Computation of the minimum resolvable temperature difference (MRTD) for a number of assumed systems shows that the limiting spatial frequency is not much affected, thermal sensitivity at intermediate frequencies, however, can be noticeably degraded. These effects can be offset by decreasing the width of the detectors and/or by increasing net thermal sensitivity.Keywords
Absorption; Convolution; Detectors; Fourier transforms; Frequency; Optical arrays; Optical crosstalk; Optical imaging; Sensor arrays; Transfer functions;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.19838
Filename
1480631
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