• DocumentCode
    106759
  • Title

    Reliable Concurrent Error Detection Architectures for Extended Euclidean-Based Division Over {\\rm GF}(2^{m})

  • Author

    Mozaffari-Kermani, Mehran ; Azarderakhsh, Reza ; Chiou-Yng Lee ; Bayat-Sarmadi, Siavash

  • Author_Institution
    Dept. of Electr. & Microelectron. Eng., Rochester Inst. of Technol., Rochester, NY, USA
  • Volume
    22
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    995
  • Lastpage
    1003
  • Abstract
    The extended Euclidean algorithm (EEA) is an important scheme for performing the division operation in finite fields. Many sensitive and security-constrained applications such as those using the elliptic curve cryptography for establishing key agreement schemes, augmented encryption approaches, and digital signature algorithms utilize this operation in their structures. Although much study is performed to realize the EEA in hardware efficiently, research on its reliable implementations needs to be done to achieve fault-immune reliable structures. In this regard, this paper presents a new concurrent error detection (CED) scheme to provide reliability for the aforementioned sensitive and constrained applications. Our proposed CED architecture is a step forward toward more reliable architectures for the EEA algorithm architectures. Through simulations and based on the number of parity bits used, the error detection capability of our CED architecture is derived to be 100% for single-bit errors and close to 99% for the experimented multiple-bit errors. In addition, we present the performance degradations of the proposed approach, leading to low-cost and reliable EEA architectures. The proposed reliable architectures are also suitable for constrained and fault-sensitive embedded applications utilizing the EEA hardware implementations.
  • Keywords
    cryptography; embedded systems; error detection; fault diagnosis; reliability; constrained embedded applications; elliptic curve cryptography; encryption; extended Euclidean-based division; fault diagnosis; fault-sensitive embedded applications; finite field GF(2m); multiple-bit errors; parity bits; reliable concurrent error detection architectures; single-bit errors; Efficient fault diagnosis; error coverage (EC); extended Euclidean algorithm (EEA); reliable and constrained embedded systems; reliable and constrained embedded systems.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2013.2260570
  • Filename
    6532418