• DocumentCode
    1067744
  • Title

    Modeling and experimental simulation of the low-frequency transfer inefficiency in bucket-brigade devices

  • Author

    Scott, David B. ; Chamberlain, Savvas G.

  • Author_Institution
    Texas Instruments, Dallas, TX
  • Volume
    27
  • Issue
    2
  • fYear
    1980
  • fDate
    2/1/1980 12:00:00 AM
  • Firstpage
    405
  • Lastpage
    414
  • Abstract
    The work presented in this paper extends the available theory and it also presents a model for the low-frequency charge transfer in MOS bucket-brigade devices (BBD´s). Our new theory which characterizes the low-frequency component of transfer inefficiency in terms of the subthreshold current is frequency independent and it incorporates both channel-length and barrier-height modulations. This model was verified experimentally on simulated BBD´s. After proving both theoretically and experimentally that the low-frequency transfer inefficiency of BBD devices is due to subthreshold current, we successfully used this knowledge to design an improved BBD device. This improved device includes only one extra ion-implantation step relative to the original BBD device. An ion implant is used in part of the BBD channel.
  • Keywords
    Charge coupled devices; Councils; Current measurement; Electron devices; Fabrication; Frequency; Implants; Information processing; MOSFET circuits; Subthreshold current;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19876
  • Filename
    1480669