• DocumentCode
    1068977
  • Title

    The use of GaAs—(Ga, Al)As heterostructures for FET devices

  • Author

    Boccon-gibod, Dominique ; Andre, Jean-pierre ; Baudet, Pierre ; Hallais, Jean-pierre

  • Author_Institution
    Laboratoires d´´Electroniques et de Physique Appliquée, Limeil-Brévannes, France
  • Volume
    27
  • Issue
    6
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    1141
  • Lastpage
    1147
  • Abstract
    The metalorganic VPE process has been applied to the growth of GaAs-GaAlAs heterostructures suitable for FET devices. Two kinds of materials are examined; namely, insulating GaAlAs hetero-buffer and heterojunction p-GaAlAs-n-GaAs, The technology of device processing uses selective etching and self-alignment techniques. The heterobuffered FET´s demonstrate effective electron confinement and the heterojunction HJFET´s exhibit a built-in voltage of 1.4 eV. However, more has to be known on the transition at the heterointerface to improve the device performances.
  • Keywords
    Buffer layers; Electrons; Etching; FETs; Gallium arsenide; Heterojunctions; Insulation; MESFETs; Positron emission tomography; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19997
  • Filename
    1480790