DocumentCode
1070053
Title
Benchmark Tests for MOSFET Compact Models With Application to the PSP Model
Author
Li, Xin ; Wu, Weimin ; Jha, Amit ; Gildenblat, Gennady ; Van Langevelde, Ronald ; Smit, Geert D J ; Scholten, Andries J. ; Klaassen, Dirk B M ; McAndrew, Colin C. ; Watts, Josef ; Olsen, C. Michael ; Coram, Geoffrey J. ; Chaudhry, Samir ; Victory, James
Author_Institution
Arizona State Univ., Tempe, AZ
Volume
56
Issue
2
fYear
2009
Firstpage
243
Lastpage
251
Abstract
This paper presents the results of several qualitative ldquobenchmarkrdquo tests that were used to verify the physical behavior of the PSP model and its usefulness for future generations of CMOS IC design. These include newly developed tests and new experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs.
Keywords
MOSFET; MOSFET compact models; analog application; mixed-signal application; Application specific integrated circuits; Benchmark testing; CMOS integrated circuits; Circuit testing; Integrated circuit modeling; Integrated circuit testing; MOSFET circuits; Radio frequency; Research and development; Semiconductor device modeling; Benchmark tests; MOSFET; compact model; surface-potential-based model;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2008.2010570
Filename
4752759
Link To Document