DocumentCode
1070288
Title
Memory-cell design in Josephson technology
Author
Zappe, Hans H.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume
27
Issue
10
fYear
1980
fDate
10/1/1980 12:00:00 AM
Firstpage
1870
Lastpage
1882
Abstract
Operating principles and criteria for the design of Josephson memory cells are reviewed and the evolution of cell design is retraced to highlight the various constraints imposed by the requirement for high speed, density, large Operating margins, and ease of auxiliary memory circuit design. Two attractive cells have emerged so far. One is a nondestructive readout (NDRO) ring cell for a subnanosecond cache memory chip; the other a destructive readout (DRO) single-flux quantum cell for main memory applications. Both are presently being used as the basis for ongoing design work.
Keywords
Cache memory; Capacitors; Circuit synthesis; Delay; Helium; Inductors; Magnetic flux; Packaging; Power dissipation; Switches;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.20124
Filename
1480917
Link To Document