DocumentCode

1070817

Title

MP-A1 technology-induced nonconstant field scaling and its impact on submicro-meter device performance

Author

Chatterjee, P.K. ; Hunter, W.R. ; Holloway ; Lin, Y.T.

Volume

27

Issue

11

fYear

1980

fDate

11/1/1980 12:00:00 AM

Firstpage

2177

Lastpage

2177

Keywords

Circuit synthesis; Computer simulation; Electron mobility; FETs; Insulation; Laboratories; Large scale integration; MOSFET circuits; Resistors; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1980.20176

Filename

1480969