• DocumentCode
    1070838
  • Title

    MP-A3 charge accumulation and mobility in thin-gate MIS devices

  • Author

    Sodini, Charlie G. ; Hoefflinger, B. ; Moll, J.L.

  • Volume
    27
  • Issue
    11
  • fYear
    1980
  • fDate
    11/1/1980 12:00:00 AM
  • Firstpage
    2177
  • Lastpage
    2178
  • Keywords
    Capacitance; Capacitance-voltage characteristics; Dielectric devices; Laboratories; Large scale integration; MIS devices; MOS devices; Threshold voltage; Transconductance; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20178
  • Filename
    1480971
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1070838