Eddy current damping of thin film domain walls

Author

Yuan, Samuel W. ; Bertram, Neal H.

Author_Institution

CMRR, California Univ., San Diago, La Jolla, CA, USA

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

2515

Lastpage

2517

Abstract

A self-consistent two-dimensional numerical model, is developed to study eddy current damped domain wall motion in conductive, soft thin films. The micromagnetic Landau-Lifshitz equation and Maxwell´s equation are solved simultaneously to provide a rigorous description of magnetization dynamics interacting with eddy current, which is relevant to the dynamic response of thin film inductive heads. Simulation results indicate that for Permalloy films thinner than 3000 Å, eddy current damping can be neglected in wall dynamics. For film thickness greater than 1 μm this damping effect could be the dominating loss mechanism

Keywords

Maxwell equations; Permalloy; eddy current losses; ferromagnetic properties of substances; magnetic domain walls; magnetic heads; magnetic thin film devices; magnetic thin films; magnetisation; numerical analysis; FeNi alloys; Maxwell´s equation; Permalloy films; conductive thin film; dynamic response; eddy current damped domain wall motion; film thickness; loss mechanism; magnetization dynamics; micromagnetic Landau-Lifshitz equation; self-consistent two-dimensional numerical model; simulation; soft thin films; thin film domain walls; thin film inductive heads; Conductive films; Damping; Differential equations; Eddy currents; Magnetic fields; Magnetic films; Maxwell equations; Numerical models; Saturation magnetization; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.280969

Filename

280969