• DocumentCode
    1071802
  • Title

    Diagnosis of a cause of life test failure in alloy diodes

  • Author

    Kingsnorth, Roland

  • Author_Institution
    Mullard Ltd., Southampton, Hampshire, United Kingdom
  • Volume
    27
  • Issue
    12
  • fYear
    1980
  • fDate
    12/1/1980 12:00:00 AM
  • Firstpage
    2312
  • Lastpage
    2316
  • Abstract
    Removal of silicon by CF4/O2plasma etching combined with optical microscope and SEM examinations of the exposed aluminum surface have been used to determine that the cause of life test failure in aluminum/silicon-alloy diodes was the presence of traces of alkali metal in the aluminum pellets used.
  • Keywords
    Aluminum; Circuit testing; Electron devices; Life testing; Optical distortion; Scanning electron microscopy; Semiconductor device testing; Semiconductor diodes; Silicon; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20271
  • Filename
    1481063
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1071802