• DocumentCode
    1072261
  • Title

    Ring oscillators fabricated in laser-annealed silicon-on-insulator

  • Author

    Lam, H.W. ; Tasch, A.F., Jr. ; Holloway, T.C. ; Lee, K.F. ; Gibbons, J.F.

  • Author_Institution
    Texas Instruments Incorporated, Dallas, Texas
  • Volume
    1
  • Issue
    6
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    99
  • Lastpage
    100
  • Abstract
    Both seven and eleven stage n-MOS ring oscillators with 6 µm channel length have been successfully fabricated in scanning. CW argon laser-annealed polycrystalline silicon islands, which are defined prior to the laser annealing step, on oxide substrates. The ring oscillators, which have a fan-out of three, have a switching delay per stage of 58 nsec and a power-delay product of about 7 pJ operating at a supply voltage (VDD) of 5 volts and switching between VDDand ground. The most serious difficulty encountered during circuit fabrication was the deformation of the silicon islands resulting from laser annealing with extensive laser power density.
  • Keywords
    Annealing; Argon; Circuits; Delay; Optical device fabrication; Power lasers; Ring lasers; Ring oscillators; Silicon on insulator technology; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1980.25245
  • Filename
    1481107