• DocumentCode
    1072721
  • Title

    Space Charging Currents and Their Effects on Spacecraft Systems

  • Author

    Reagan, J.B. ; Meyerott, R.E. ; Gaines, E.E. ; Nightingale, R.W. ; Filbert, P.C. ; Imhof, W.L.

  • Author_Institution
    Space Sciences Laboratory Lockheed Palo Alto Research Laboratory Palo Alto, CA
  • Issue
    3
  • fYear
    1983
  • fDate
    6/1/1983 12:00:00 AM
  • Firstpage
    354
  • Lastpage
    365
  • Abstract
    The range and limits on the space charging electron currents available in the near-geosynchronous orbit have been identified from a large SCATHA satellite data base. The most intense current densities observed were 0.8 nA/cm2 at 1 keV and 0.5 pA/cm2 at 1 MeV. The effects of these currents on both surface and internal charging of dielectrics have been modeled. In exposed dielectrics radiation-induced effects significantly increase the conductivity within the first few ¿m of the surface, produce permanent radiation damage, and affect the final potential of the sample. The calculated electric field profiles and surface potential of a 127 ¿m Kapton® sample are found to be consistent with the voltage measured aboard the SCATHA satellite during a charging event. The calculated field strength of 2×105 V/cm is below the spontaneous breakdown level. Transient electrical pulses observed in association with the charging may therefore be due to capacitive coupling effects rather than to breakdown. The electric fields and voltage internal to both plane-parallel and coaxial geometries containing a Teflon® dielectric enclosed between two conductors have also been modeled. Electric field strengths of a few x 105 V/cm and internal potentials of several kV are calculated for these typical configurations when exposed to the direct electrons in unusually energetic events.
  • Keywords
    Conductivity; Current density; Dielectrics; Electric breakdown; Electrons; Satellites; Space charge; Space vehicles; Surface charging; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1983.298625
  • Filename
    4081111