• DocumentCode
    1072734
  • Title

    21st IEEE International Conference on Microelectronic Test Structures

  • Volume
    54
  • Issue
    8
  • fYear
    2007
  • Firstpage
    2067
  • Lastpage
    2067
  • Abstract
    Provides notice of upcoming conference events of interest to practitioners and researchers.
  • Keywords
    Object recognition;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.904372
  • Filename
    4277973
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1072734