Perpendicular magnetic anisotropy of bias sputtered Co/Pt and Co/Pd multilayers

Author

Honda, S. ; Tamura, Y. ; Takeuchi, T. ; Nawate, M.

Author_Institution

Fac. of Eng., Hiroshima Univ., Japan

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

3364

Lastpage

3366

Abstract

The lattice strain and the magnetic anisotropy have been examined for as-deposited and post-annealed Co/Pt and Co/Pd multilayers, which have been sputter-deposited on glass substrates with bias voltage. For Co/Pt multilayers, the interface anisotropy, K_s, has mainly the Neel type origin in the flat, smooth, and sharp interfaces, while the volume anisotropy, K_v, is sensitive to the magnetoelastic effect. For Co/Pd multilayers, the magnetoelastic effect plays the main role in K_s and K_v

Keywords

annealing; cobalt; magnetic anisotropy; magnetic multilayers; magnetic thin films; magnetoelastic effects; palladium; platinum; sputtered coatings; Neel type origin; as deposited multilayers; bias sputtered Co-Pd multilayers; bias sputtered Co-Pt multilayers; bias voltage; flat interfaces; glass substrates; interface anisotropy; lattice strain; magnetoelastic effect; perpendicular magnetic anisotropy; post annealed multilayers; sharp interfaces; smooth interfaces; volume anisotropy; Anisotropic magnetoresistance; Annealing; Lattices; Magnetic anisotropy; Magnetic field induced strain; Magnetic multilayers; Magnetoelasticity; Perpendicular magnetic anisotropy; Strain measurement; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.281177

Filename

281177