• DocumentCode
    1073826
  • Title

    A new degradation phenomenon in blue light emitting silicon carbide diodes

  • Author

    Ziegler, Gunther ; Theis, Dietmar

  • Author_Institution
    Siemens Research Laboratories, Erlangen, München, West Germany
  • Volume
    28
  • Issue
    4
  • fYear
    1981
  • fDate
    4/1/1981 12:00:00 AM
  • Firstpage
    425
  • Lastpage
    427
  • Abstract
    In 6H-SiC blue emitting diodes prepared by sawing epitaxial wafers the development of greenish striations in the luminescing layer is observed together with a decrease in external quantum efficiency. It is proposed that this degradation is due to the development of numerous stacking faults leading to an intermediate (cubic?) state of lower band gap than the 6H modification.
  • Keywords
    Aging; Chemicals; Conducting materials; Current density; Degradation; Light emitting diodes; Photonic band gap; Sawing; Silicon carbide; Stacking;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20359
  • Filename
    1481511
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1073826