• DocumentCode
    1074385
  • Title

    Optoelectronic Measurement of Partial Arcs on a Contaminated Surface

  • Author

    Matsumoto, T. ; Ishii, M. ; Kawamura, T.

  • Author_Institution
    Dept. of Electical Eng. Shizuoka University3-5-1, Johoku, Hamamatsu Shizuoka 432, Japan
  • Issue
    6
  • fYear
    1984
  • Firstpage
    543
  • Lastpage
    549
  • Abstract
    In this paper, characteristics of a partial arc on a contaminated surface containing NaCl, measured by optoelectronic techniques, are described. Streak photographs using a solid state image sensing device clarified propagation characteristics and temporal variations of the diameter of a partial arc. A spectroscopic measurement revealed that most of the light emitted from the arc consists of the Na spectrum, and the temperature of the arc column is lower than that of a free-air arc. The calculated results on physical characteristics of the partial arc are discussed together with the experimental results.
  • Keywords
    Integrated circuit measurements; Lenses; Optical propagation; Pollution measurement; Solid state circuits; Spectroscopy; Surface contamination; Temperature sensors; Velocity measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1984.298827
  • Filename
    4081292