• DocumentCode
    1076481
  • Title

    Nanostructure and magnetic properties of FePt:C cluster films

  • Author

    Xu, Yingfan ; Yan, M.L. ; Sellmyer, D.J.

  • Author_Institution
    Dept. of Phys., Univ. of Nebraska, Lincoln, NE, USA
  • Volume
    40
  • Issue
    4
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    2525
  • Lastpage
    2527
  • Abstract
    Magnetic properties and nanostructure of FePt:C cluster-deposited films with C volume fraction of 7%, 14%, 33%, and 45% have been studied. As-deposited FePt:C films were prepared by a multilayer method in which FePt layers were deposited from a cluster source employing a gas-aggregation technique and C layers from a normal sputtering gun. In the as-deposited films, FePt clusters with fcc structure are embedded in the C matrix. The high anisotropy FePt L10 cluster structure was realized in the films via post-deposition annealing and the nanostructure of the films was observed by high-resolution transmission electron microscope (TEM). The results for a film with 45 vol. % C showed that FePt clusters are well separated by C matrix and the cluster diameter is about 4.5 nm. The coercivity increases with increase of annealing temperature; coercivities larger than 9 kOe were achieved in the films after annealing at a temperature of 700°C and above. Magnetization reversal of the films was studied by moment-decay measurements and the data were fitted with the Sharrock formula. For the film with 45 vol. % C annealed at 625°C, the thermal stability factor KuV*/kB,T activation volume V*, and anisotropy constant Ku are 231, 0.83×10-18cm3 and 1.2×107 erg/cm3, respectively.
  • Keywords
    ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic annealing; magnetisation reversal; nanostructured materials; platinum alloys; thermal stability; transmission electron microscopy; 4.5 nm; 625 C; 700 C; FePt clusters; FePt layers; FePt:C; Sharrock formula; activation volume; anisotropy FePt cluster structure; anisotropy constant; as-deposited films; cluster source; cluster-deposited films; gas-aggregation technique; high-resolution transmission electron microscope; magnetic properties; magnetization reversal; moment-decay measurements; multilayer method; nanocluster; nanostructure properties; post-deposition annealing; sputtering gun; thermal stability; Anisotropic magnetoresistance; Annealing; Coercive force; Magnetic films; Magnetic multilayers; Magnetic properties; Magnetization reversal; Sputtering; Temperature; Transmission electron microscopy; FePt; L1$_0$structure; high anisotropy; nanocluster; thermal stability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2004.832496
  • Filename
    1325558